Item parameter recovery, standard error estimates, and fit statistics of the WINSTEPS program for the family of Rasch models

Educational and Psychological Measurement

Volumn 65, Issue 3, 2005, Pages 376-404

  Wang, Wen Chung ^a   Chen, Cheng Te ^a  

^a NATIONAL CHUNG CHENG UNIVERSITY   (Taiwan)

Author keywords

Infit; Joint maximum likelihood estimation; Outfit; Rasch model; Rating scale model

Indexed keywords

EID: 20744437724     PISSN: 00131644     EISSN: None     Source Type: Journal    
DOI: 10.1177/0013164404268673     Document Type: Article

References (20)

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