Dielectric characterization in a broad frequency and temperature range of Sr Bi2 Nb2 O9 thin films grown on Pt electrodes

Journal of Applied Physics

Volumn 97, Issue 11, 2005, Pages

  Guilloux Viry, M ^a   Duclre J R ^a,d   Rousseau, A ^a   Perrin, A ^a   Fasquelle, D ^b   Carru, J C ^b   Cattan, E ^c   Soyer, C ^c   Rmiens D ^c  

^a UNIVERSITÉ DE RENNES 1   (France)

^b UNIVERSITÉ DU LITTORAL CÔTE D OPALE   (France)

^c INSTITUT D ELECTRONIQUE   (France)

^d DUBLIN CITY UNIVERSITY   (Ireland)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC CHARACTERIZATION; FATIGUE-RESISTANT PROPERTIES; FERROELECTRIC FILMS; REMANENT POLARIZATION;

CRYSTALLIZATION; DIELECTRIC MATERIALS; ELECTRODES; EPITAXIAL GROWTH; FILM GROWTH; PLATINUM; PULSED LASER DEPOSITION; STRONTIUM COMPOUNDS;

THIN FILMS;

EID: 20744433228     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1904726     Document Type: Article

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