RADIUS - Rapid particle analysis of digital images by ultra-high-resolution scanning of thin sections

Sedimentology

Volumn 52, Issue 3, 2005, Pages 669-681

  Seelos, Klemens ^a   Sirocko, Frank ^a  

^a JOHANNES GUTENBERG UNIVERSITY   (Germany)

Author keywords

Digital image processing; Loess; Numerical analysis; Particle size; Pattern recognition; Thin section

Indexed keywords

DIGITAL IMAGE; PARTICLE SIZE; SEDIMENT ANALYSIS; THIN SECTION;

EID: 20644470347     PISSN: 00370746     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1365-3091.2005.00715.x     Document Type: Article

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