Radiation hardness of CsBr:Eu2+

Journal of Luminescence

Volumn 114, Issue 1, 2005, Pages 24-30

  Zimmermann, J ^a,b   Hesse, S ^a   Von Seggern, H ^a   Fuchs, M ^b   Knupfer W ^b  

^a DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

^b SIEMENS AG   (Germany)

Author keywords

Csbr:Eu2+; Photostimulated luminescence; Radiation induced defects; Storage phosphors; X ray

Indexed keywords

ABSORPTION SPECTROSCOPY; AGGLOMERATION; ELECTRON TRANSITIONS; EUROPIUM; FLUORESCENCE; HARDNESS; PHOSPHORS; ULTRAVIOLET RADIATION; X RAYS;

LUMINESCENCE QUENCHING; PHOTOSTIMULATED LUMINESCENCE (PSL); STORAGE PHOSPHORS; X RAY DOSES;

RADIATION DAMAGE;

EID: 20544473268     PISSN: 00222313     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jlumin.2004.11.011     Document Type: Article

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