Structural characterization of carbon nanosheets via x-ray scattering

Journal of Applied Physics

Volumn 97, Issue 11, 2005, Pages

  French, B L ^a   Wang, J J ^a   Zhu, M Y ^a   Holloway, B C ^a  

^a The College of William and Mary   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON NANOSHEETS; CRYSTALLINE GRAPHITE; DEBYE SCATTERING EQUATION; MESOCARBON MICROBEADS;

DATA ACQUISITION; FULLERENES; MICROSTRUCTURE; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; SCANNING ELECTRON MICROSCOPY; X RAY SCATTERING;

CARBON NANOTUBES;

EID: 20544452747     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1927284     Document Type: Article

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