|
Volumn 5, Issue , 2004, Pages 1241-1244
|
Fingerprint image quality analysis
|
Author keywords
[No Author keywords available]
|
Indexed keywords
AUTOMATIC FINGERPRINT IDENTIFICATION SYSTEM (AFIS);
FINGERPRINT;
MASK-SHIFTING PROCESS;
QUALITY DETERMINATION PROCESS;
CMOS INTEGRATED CIRCUITS;
FEATURE EXTRACTION;
FREQUENCY DOMAIN ANALYSIS;
IMAGE ANALYSIS;
MATHEMATICAL MODELS;
NATURAL FREQUENCIES;
PATTERN RECOGNITION SYSTEMS;
SPURIOUS SIGNAL NOISE;
IMAGE QUALITY;
|
EID: 20444500948
PISSN: 15224880
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (51)
|
References (8)
|