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Volumn 546, Issue 1-2, 2005, Pages 51-55
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The NA60 silicon vertex spectrometer
e
CERN
(Switzerland)
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Author keywords
Radiation damage; Silicon pixel detector
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Indexed keywords
MICROPROCESSOR CHIPS;
PLASMAS;
PROTONS;
RADIATION DAMAGE;
RESONANCE;
SILICON;
SPECTRUM ANALYSIS;
STATISTICAL METHODS;
VECTORS;
NUCLEUS-NUCLEUS COLLISIONS;
QUARK GLUON PLASMA (QGP);
SILICON PIXEL DETECTOR;
SILICON VERTEX SPECTROMETER;
SPECTROMETERS;
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EID: 20444500211
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nima.2005.03.013 Document Type: Conference Paper |
Times cited : (7)
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References (7)
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