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Volumn 546, Issue 1-2, 2005, Pages 51-55

The NA60 silicon vertex spectrometer

Author keywords

Radiation damage; Silicon pixel detector

Indexed keywords

MICROPROCESSOR CHIPS; PLASMAS; PROTONS; RADIATION DAMAGE; RESONANCE; SILICON; SPECTRUM ANALYSIS; STATISTICAL METHODS; VECTORS;

EID: 20444500211     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2005.03.013     Document Type: Conference Paper
Times cited : (7)

References (7)
  • 1
    • 20444435404 scopus 로고    scopus 로고
    • K. Wyllie, presentation at this Workshop
    • K. Wyllie, presentation at this Workshop.
  • 3
    • 20444499291 scopus 로고    scopus 로고
    • A. Fassò, et al., eConf C0303241, MOMT004 (2003) [arXiv:physics/0306162].
    • A. Fassò, et al., eConf C0303241, MOMT004 (2003) [arXiv:physics/0306162].
  • 6
    • 20444508114 scopus 로고    scopus 로고
    • First results on Dimuon production from the NA60 experiment
    • [NA60 Coll.]
    • H. K. Wöhri, et al. [NA60 Coll.], First results on Dimuon production from the NA60 experiment, Frascati Phys. Series 34 (2004) 185.
    • (2004) Frascati Phys. Series , vol.34 , pp. 185
    • Wöhri, H.K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.