An outlier analysis framework for impedance-based structural health monitoring

Journal of Sound and Vibration

Volumn 286, Issue 1-2, 2005, Pages 229-250

  Park, Gyuhae ^a   Rutherford, Amanda C ^a   Sohn, Hoon ^a   Farrar, Charles R ^a  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; DEGREES OF FREEDOM (MECHANICS); ELECTRIC IMPEDANCE; MATHEMATICAL MODELS; PATTERN RECOGNITION; REGRESSION ANALYSIS;

AUTO REGRESSIVE MODELS; DAMAGE CLASSIFICATION; DAMAGE IDENTIFICATION; IMPEDANCE BASED STRUCTURAL HEALTH MONITORING;

STRUCTURAL ANALYSIS;

EID: 20444498674     PISSN: 0022460X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jsv.2004.10.013     Document Type: Article

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