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Volumn , Issue , 2004, Pages 15-22
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Low resolution character recognition by dual eigenspace and synthetic degraded patterns
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Author keywords
Character recognition; Degradation model; Dual eigenspace; Grayscale feature extraction
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Indexed keywords
CAMERAS;
DEGRADATION;
EIGENVALUES AND EIGENFUNCTIONS;
EMBEDDED SYSTEMS;
FEATURE EXTRACTION;
IMAGE PROCESSING;
MATHEMATICAL MODELS;
OPTICAL RESOLVING POWER;
ROBUSTNESS (CONTROL SYSTEMS);
SPURIOUS SIGNAL NOISE;
DEGRADATION MODEL;
DUAL EIGENSPACE;
GRAYSCALE FEATURE EXTRACTION;
OCR ENGINES;
OPTICAL CHARACTER RECOGNITION;
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EID: 20444496589
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1145/1031442.1031445 Document Type: Conference Paper |
Times cited : (10)
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References (9)
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