'In-situ' observation of dynamical diffraction by means of Medipix2 sensor crystal fulfilling Bragg condition

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 546, Issue 1-2, 2005, Pages 135-139

  Mitschke, M ^a,d   Pernot, P ^b,c   Helfen, L ^c,d   Scherzer, S ^a   Zwerger, A ^e   Baumbach, T ^b,d  

^a UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

^b KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

^c EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^d FRAUNHOFER INSTITUTE FOR NON DESTRUCTIVE TESTING   (Germany)

^e UNIVERSITY OF FREIBURG   (Germany)

Author keywords

Photon counting; Semiconductor detectors; X ray diffraction; X ray imaging

Indexed keywords

ABSORPTION; CRYSTALS; SEMICONDUCTOR MATERIALS; SENSORS; SILICON; X RAY ANALYSIS;

HYBRID PIXEL DETECTORS; PHOTON COUNTING; SEMICONDUCTOR DETECTORS; X-RAY IMAGING;

X RAY DIFFRACTION ANALYSIS;

EID: 20444491636     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2005.03.046     Document Type: Conference Paper

References (5)

1. Medipix2 Collaboration, http://medipix.web.cern.ch/medipix.
2. X. Llopart Cudie IEEE Trans. Nucl. Sci. NS-49 2002 2279
3. B.W. Batterman, and H. Cole Rev. Mod. Phys. 36 3 1964 681
4. A. Authier International Union of Crystallography Monographs on Crystallography vol. 11 2001
5. J. Baruchel, A. Draperi, and F. Zontone J. Phys. D Appl. Phys. 26 1993 9