Triplet recombination at P b centers and its implications for capture cross sections

Journal of Applied Physics

Volumn 97, Issue 5, 2005, Pages

  Friedrich, Felice ^a   Boehme, Christoph ^a   Lips, Klaus ^a  

^a HAHN MEITNER INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BAND GAP; ELECTRON CAPTURE; MAGNETIC RESONANCE MEASUREMENTS; PARAMAGNETIC DEFECTS;

DIFFUSION; INTERFACES (MATERIALS); PARAMAGNETIC RESONANCE; PHOTOCURRENTS; RELAXATION PROCESSES; SILICA; SILICON; TRANSPORT PROPERTIES;

CRYSTALLINE MATERIALS;

EID: 20444490709     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1851593     Document Type: Article

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