A robust approach to demodulating and unwrapping phase-stepped photoelastic data

Experimental Mechanics

Volumn 45, Issue 3, 2005, Pages 278-289

  Siegmann, P ^a   Backman, D ^b   Patterson, Eann A ^a,c  

^a UNIVERSITY OF SHEFFIELD   (United Kingdom)

^b NATIONAL RESEARCH COUNCIL CANADA   (Canada)

^c Michigan State University   (United States)

Author keywords

Finite element analysis; Phase stepping; Photoelasticity

Indexed keywords

AEROSPACE INDUSTRY; ALGORITHMS; DEMODULATION; QUALITY ASSURANCE; ROBUSTNESS (CONTROL SYSTEMS);

COMPLEX FRINGE PATTERNS; FINITE ELEMENT MODELING; ISOCLINIC FRINGES;

PHOTOELASTICITY;

ELASTICITY; FINITE ELEMENT ANALYSIS;

EID: 20444490677     PISSN: 00144851     EISSN: None     Source Type: Journal    
DOI: 10.1177/0014485105054326     Document Type: Article

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