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Volumn 25, Issue 12 SPEC. ISS., 2005, Pages 2045-2049

Density improvement of the sol-gel dip-coated SnO2 films by chemical surface modification

Author keywords

Films; Firing; Porosity; Sol gel processes; X ray methods

Indexed keywords

AGGLOMERATION; DENSIFICATION; DENSITY (SPECIFIC GRAVITY); FIRING (OF MATERIALS); LOW TEMPERATURE EFFECTS; SURFACE TREATMENT; TIN COMPOUNDS; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 20444456663     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jeurceramsoc.2005.03.009     Document Type: Article
Times cited : (11)

References (12)
  • 3
    • 0032660730 scopus 로고    scopus 로고
    • Sintering and crystallite growth of nanocrystalline copper doped tin oxide
    • C.V. Santilli S.H. Pulcinelli G.E.S. Brito V. Briois Sintering and crystallite growth of nanocrystalline copper doped tin oxide J. Phys. Chem. B 103 1999 2660-2667.
    • (1999) J. Phys. Chem. B , vol.103 , pp. 2660-2667
    • Santilli, C.V.1    Pulcinelli, S.H.2    Brito, G.E.S.3    Briois, V.4
  • 7
    • 0000515073 scopus 로고
    • Characterization of surfaces by grazing X-ray reflection-application to study of polishing of some silicate-glasses
    • L. Nèvot P. Croce Characterization of surfaces by grazing X-ray reflection-application to study of polishing of some silicate-glasses Rev. Phys. Appl. 15 1980 761-779.
    • (1980) Rev. Phys. Appl. , vol.15 , pp. 761-779
    • Nèvot, L.1    Croce, P.2
  • 8
    • 0030562697 scopus 로고    scopus 로고
    • X-ray reflectivity: A new tool for the study of glass surfaces
    • J.M. Grimal P. Chartier P. Lehuédé X-ray reflectivity: A new tool for the study of glass surfaces J. Non-Cryst. Solids 196 1996 128-133.
    • (1996) J. Non-Cryst. Solids , vol.196 , pp. 128-133
    • Grimal, J.M.1    Chartier, P.2    Lehuédé, P.3
  • 9
    • 0004301224 scopus 로고    scopus 로고
    • Round Midnight, EXAFS signal treatment and refinement programs
    • LURE, Orsay, France, Programs available on LURE website
    • Michalowicz, A., Round Midnight, EXAFS signal treatment and refinement programs, LURE, Orsay, France. Programs available on LURE website; http://www.LURE.fr/.
    • Michalowicz, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.