Far-infrared and Raman spectroscopy of BaTiO3 thin films

Ferroelectrics

Volumn 303, Issue , 2004, Pages 173-175

  Ostapchuk, T ^a   Petzelt, J ^a   Pokorny J ^a   Pashkin, A ^a   Zelezny V ^a   Dressel, M ^b   Gorshunov, B ^b,c  

^a INSTITUTE OF PHYSICS   (Czech Republic)

^b UNIVERSITY OF STUTTGART   (Germany)

^c PROKHOROV GENERAL PHYSICS INSTITUTE   (Russian Federation)

Author keywords

BaTiO3 films; Dielectric function; Far infrared transmittance; Raman scattering

Indexed keywords

BARIUM TITANATE; LATTICE VIBRATIONS; PHASE TRANSITIONS; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SUBSTRATES; THERMAL EFFECTS;

BATIO3 FILMS; DIELECTRIC FUNCTIONS; FAR INFRARED TRANSMITTANCE;

THIN FILMS;

EID: 20444451530     PISSN: 00150193     EISSN: 15635112     Source Type: Conference Proceeding    
DOI: 10.1080/00150190490453577     Document Type: Article

References (3)

1. 3 thin films grown on sapphire substrates. Thin Solid Films 422, 8-13 (2002).
2. Y. Luspin, J. L. Servoin, and R Gervais, Soft mode spectroscopy in barium titanate. J. Phys. C Solid St. Phys. 13, 3761-3773 (1980).
3. I. Rychetský, J. Petzelt, and T. Ostapchuk, Grain-boundary and crack effects on the dielectric response of high-permittivity films and ceramics. Appl. Phys. Lett. 81, 4224-4226 (2002).