|
Volumn 53, Issue 13, 2005, Pages 3601-3612
|
Predicting yield-stress anomalies in L12 alloys: Ni 3Ge-Fe3Ge pseudo-binaries
|
Author keywords
Ab initio calculation; Defects; Intermetallic; Thermally activated processes; Yield phenomena
|
Indexed keywords
CRYSTAL DEFECTS;
DISSOCIATION;
ELASTICITY;
ELECTRONIC STRUCTURE;
INTERMETALLICS;
SOLID SOLUTIONS;
STOICHIOMETRY;
YIELD STRESS;
AB INITIO CALCULATIONS;
PSEUDO-BINARIES;
THERMALLY ACTIVATED PROCESSES;
YIELD PHENOMENA;
BINARY ALLOYS;
|
EID: 20444443568
PISSN: 13596454
EISSN: None
Source Type: Journal
DOI: 10.1016/j.actamat.2005.04.011 Document Type: Article |
Times cited : (28)
|
References (62)
|