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Volumn 53, Issue 13, 2005, Pages 3601-3612

Predicting yield-stress anomalies in L12 alloys: Ni 3Ge-Fe3Ge pseudo-binaries

Author keywords

Ab initio calculation; Defects; Intermetallic; Thermally activated processes; Yield phenomena

Indexed keywords

CRYSTAL DEFECTS; DISSOCIATION; ELASTICITY; ELECTRONIC STRUCTURE; INTERMETALLICS; SOLID SOLUTIONS; STOICHIOMETRY; YIELD STRESS;

EID: 20444443568     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2005.04.011     Document Type: Article
Times cited : (28)

References (62)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.