Mid-infrared electric field characterization using a visible charge-coupled-device-based spectrometer

Optics Letters

Volumn 30, Issue 10, 2005, Pages 1228-1230

  Kubarych, Kevin J ^a   Joffre, Manuel ^a   Moore, Amy ^b   Belabas, Nadia ^b   Jonas, David M ^b  

^a LABORATOIRE D OPTIQUE ET BIOSCIENCES   (France)

^b UNIVERSITY OF COLORADO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MID-INFRARED PULSES; POWER SPECTRUM; SPECTRAL PHASE INTERFEROMETRY; UPCONVERSION;

CAMERAS; CHARGE COUPLED DEVICES; ELECTRIC FIELD EFFECTS; INTERFEROMETRY; SILICON; SPECTROMETERS; ULTRASHORT PULSES;

INFRARED RADIATION;

EID: 20444424178     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.30.001228     Document Type: Article

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