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Volumn 708, Issue , 2004, Pages 432-433

Crack patterns in drying process show memories contained inside granular networks

Author keywords

[No Author keywords available]

Indexed keywords

COMPLEX NETWORKS; DYNAMICS; MAGNETIC DISK STORAGE; YIELD STRESS;

EID: 20444422004     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.1764193     Document Type: Conference Paper
Times cited : (2)

References (3)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.