A new method for study of the evaporation rate of cathodes

IVESC2004 - 5th International Vacuum Electron Sources Conference Proceedings

Volumn , Issue , 2004, Pages 214-215

  Liu, Yanwen ^a   Zhang, Honglai ^a  

^a INSTITUTE OF ELECTRONICS   (China)

Author keywords

Cathode evaporation rate; Time of flight mass spectrometer

Indexed keywords

CURRENT DENSITY; ELECTRIC FIELDS; ELECTRON GUNS; EVAPORATION; IMPREGNATION; IONIZATION CHAMBERS; MASS SPECTROMETERS; TUNGSTEN;

CATHODE EVAPORATION RATE; EMISSION CURRENTS; IONIZATION EFFICIENCY; TIME-OF-FLIGHT MASS SPECTROMETERS (TOFMS);

CATHODES;

EID: 20444417851     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)

1. J.A.Becker, phenomena in oxide cathode filaments, phys.Rev.1929,34,1323-1351.
2. I.Brodie,R.O.jenbinsandW.G.Trodden EvaporationofBarium-Calcium-Aluminate,J.Electr.contr.1959,6,149-161
3. W.R.Smythe and J.Mattaach,A newmass spectrometer,phys.Rev. 1932.40.429-433
4. A.E.Cameron and D.F.Eggers,An Ion "velocitron", The.Rev.Sci.Instr. 1948,19,605-609.
5. W.C.Wiley and I.H.Mclaren, Time-of-flight mass spectrometer with Improved Resolution,The Rev.sci.Instr.1955,26,1150-1157