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Volumn 30, Issue 6, 1998, Pages 574-
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Studies on etching and damage action of low energy ion beam on microbial cells
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Author keywords
Etching action; Free radicals; Inhibitor for damage repair; Ion implantation; Microbiological cells
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Indexed keywords
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EID: 20444406896
PISSN: 05829879
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (6)
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References (6)
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