Report of the CIPM key comparison CCRI(II)-K2.Y-90

Metrologia

Volumn 42, Issue SUPPL., 2005, Pages 06001-

  Zimmerman, E ^a   Ratel, G ^b  

^a INTERNATIONAL ATOMIC ENERGY AGENCY   (Austria)

^b PAVILLON DE BRETEUIL   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CONCENTRATION (PROCESS); DATABASE SYSTEMS; GRAPH THEORY; IONIZATION OF GASES; RADIOACTIVITY;

CONSULTATIVE COMMITTEE FOR IONIZING RADIATION (CCRI(II)); GRAPHICAL PRESENTATION; MUTUAL RECOGNITION ARRANGEMENT (MRA); NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY (NIST);

ELEMENTARY PARTICLES;

EID: 20444399985     PISSN: 00261394     EISSN: 16817575     Source Type: Journal    
DOI: 10.1088/0026-1394/42/1A/06001     Document Type: Article

References (0)