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Volumn 49, Issue 4, 2005, Pages 351-358

Comparison of quartz standards for X-ray diffraction analysis: HSE A9950 (Sikron F600) and NIST SRM 1878

Author keywords

Crystalline silica; Quartz; X ray diffraction

Indexed keywords

CRYSTALLINE MATERIALS; PARTICLE SIZE ANALYSIS; STANDARDS; X RAY DIFFRACTION ANALYSIS; PARTICLE SIZE; QUARTZ; X RAY DIFFRACTION;

EID: 20444375059     PISSN: 00034878     EISSN: None     Source Type: Journal    
DOI: 10.1093/annhyg/meh095     Document Type: Article
Times cited : (42)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.