Complex observation in electron microscopy: V. Phase retrieval for strong objects with foucault knife-edge scanning

Journal of the Physical Society of Japan

Volumn 73, Issue 10, 2004, Pages 2725-2731

  Nagayama, Kuniaki ^a  

^a OKAZAKI INSTITUTE FOR INTEGRATIVE BIOSCIENCE   (Japan)

Author keywords

Differential contrast; Electron microscopy; Knife edge; Observation; Phase retrieval; Schlieren; Strong object

Indexed keywords

ARTICLE; CALCULATION; FILTER; IMAGE RECONSTRUCTION; SIMULATION; THEORY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 20444371578     PISSN: 00319015     EISSN: None     Source Type: Journal    
DOI: 10.1143/JPSJ.73.2725     Document Type: Article

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