A stochastic set-covering location model for both ameliorating and deteriorating items

Computers and Industrial Engineering

Volumn 46, Issue 2, 2004, Pages 313-319

  Hwang, Heung Suk ^a  

^a Dong Eui University   (South Korea)

Author keywords

Facility location; Layout; Logistics; Systematic planning

Indexed keywords

COMPUTER PROGRAMMING; COSTS; ENGINEERING FACILITIES; GRAPHICAL USER INTERFACES; INTEGRATION; INVENTORY CONTROL; LOGISTICS; MATHEMATICAL MODELS; PARAMETER ESTIMATION; PROBLEM SOLVING; RANDOM PROCESSES;

AMELIORATING RATES; DETERIORATING RATES; FACILITY LOCATION; LAYOUT; SYSTEMATIC PLANNING;

INDUSTRIAL ENGINEERING;

EID: 2042543421     PISSN: 03608352     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cie.2003.12.010     Document Type: Conference Paper

References (9)

1. Aly A.A., White J.A. Probabilistic formulation of emergency service facility location problem. Journal of Operations Research Society. 29:1979;1167-1179.
2. Fiala F. Solution of linear programming in 0-1 variables, algorithm 449. Communications of ACM. 16:(7):1975;445-447.
3. Ghare P.M., Schrader G.G. A model for an exponentially decaying inventory. Journal of Industrial Engineering X IV. 5:1981;234-238.
4. Heng K.J., Linn R.J. An order level lot size inventory model for deteriorating items with finite replenishment rate. International Journal of Computational and Industrial Engineering. 20:(2):1991;187-197.
5. Hwang, H.S (1982). Analysis of some decaying inventory systems with a class of issuing policies. PhD dissertation, KAIST (Korea Advanced Institute of Science and Technology).
6. Hwang H., Hwang H.S. Optimal issuing policy in production lot size system for items with Weibull deterioration. International Journal of Production Research. 20:(1):1982;87-94.
7. Kevorkian J., Cole J.D. Perturbation methods in applied mathematics. 1981;Spring Verig, New York.
8. Kuhn H.W. A note on Fermat's problem. Mathematical Programming. 4:1973;98-107.
9. Raafat F., Eldin H. An inventory model for deteriorating items. International Journal of Computational and Industrial Engineering. 20:(1):1991;89-94.