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Volumn 75, Issue 4, 2004, Pages 1081-1088

X-ray powder diffractometer for in situ structural studies in magnetic fields from 0 to 35 kOe between 2.2 and 315 K

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; CRYOSTATS; CRYSTAL ATOMIC STRUCTURE; ELECTRIC CONDUCTIVITY; MAGNETIC SHIELDING; MAGNETIZATION; MAGNETOSTRICTION; PHASE TRANSITIONS; SUPERCONDUCTING MAGNETS; TEMPERATURE; X RAY POWDER DIFFRACTION;

EID: 2042472175     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1667253     Document Type: Article
Times cited : (82)

References (19)
  • 2
    • 0004060848 scopus 로고    scopus 로고
    • edited by W. I. F. David, K. Shankland, L. B. McCuster, and Ch. Baerlocher (Oxford University Press, Oxford)
    • Structure Determination from Powder Diffraction Data, edited by W. I. F. David, K. Shankland, L. B. McCuster, and Ch. Baerlocher (Oxford University Press, Oxford, 2002).
    • (2002) Structure Determination from Powder Diffraction Data
  • 7
    • 0004326059 scopus 로고
    • edited by R. A. Young (Oxford University Press, Oxford)
    • The Rietveld Method, edited by R. A. Young (Oxford University Press, Oxford, 1993).
    • (1993) The Rietveld Method
  • 18
    • 2042526435 scopus 로고    scopus 로고
    • NIST/SEMATECH e-Handbook of Statistical Methods, http://www.itl.nist.gov/div898/handbook/pmd/section6/pmd641.htm (2003).
    • (2003)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.