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Volumn 432, Issue 2, 2005, Pages 169-176
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About models and methods to describe chip-calorimeters and determine sample properties from the measured signal
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Author keywords
Calorimetry; Chip calorimeter; Heat capacity; IC calorimeter; Model
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Indexed keywords
COMPUTER SIMULATION;
HEAT CONDUCTION;
HEAT FLUX;
MICROPROCESSOR CHIPS;
MODELS;
PARTIAL DIFFERENTIAL EQUATIONS;
SILICA;
SPECIFIC HEAT;
THERMODYNAMIC PROPERTIES;
THIN FILMS;
CHIP-CALORIMETERS;
COMPUTER ALGEBRA SYSTEMS;
IC CALORIMETERS;
VERY THIN SILICA MEMBRANES;
CALORIMETERS;
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EID: 20344407836
PISSN: 00406031
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tca.2005.02.008 Document Type: Conference Paper |
Times cited : (10)
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References (17)
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