Prediction of damage threshold fluences for metal films by an ultrashort laser pulse

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5662, Issue , 2004, Pages 667-672

  Jiang, Lan ^a   George, Nnu ^a   Tsai, Hai Lung ^a  

^a University of Missouri Rolla   (United States)

Author keywords

Metal thin film; Quantum treatment; Threshold fluence; Two temperature model; Ultrashort pulse laser

Indexed keywords

ELECTRON TRANSPORT PROPERTIES; FERMI LEVEL; MATHEMATICAL MODELS; METALLIC FILMS; PHONONS; QUANTUM THEORY; RELAXATION PROCESSES; SPECIFIC HEAT; THERMAL EFFECTS; THIN FILMS; ULTRASHORT PULSES;

METAL THIN FILM; QUANTUM TREATMENT; THRESHOLD FLUENCE; TWO-TEMPERATURE MODEL; ULTRASHORT PULSE LASER;

LASER APPLICATIONS;

EID: 20344403073     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.596574     Document Type: Conference Paper

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