Beware the consequences of citing self-plagiarism

Communications of the ACM

Volumn 48, Issue 6, 2005, Pages 13-

  Neville, Charles W ^a   Wadler, Philip ^b  

^a ACM SIGPLAN Executive Committee ^*

^b ACM SIGPLAN Executive Committee

Author keywords

[No Author keywords available]

Indexed keywords

EID: 20344399395     PISSN: 00010782     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Letter

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