An X-ray photoelectron spectroscopy study of BaAl2S4 thin films

Journal of Electron Spectroscopy and Related Phenomena

Volumn 148, Issue 2, 2005, Pages 91-95

  Smet, Philippe F ^a   Van Haecke, Jo E ^a   Van Meirhaeghe, Roland L ^a   Poelman, Dirk ^a  

^a GHENT UNIVERSITY   (Belgium)

Author keywords

BaAl2S4; Electroluminescence; Impurities in semiconductors; Thermal annealing; Thin films; X ray photoelectron spectroscopy (XPS)

Indexed keywords

ANNEALING; BARIUM COMPOUNDS; BINDING ENERGY; ELECTROLUMINESCENCE; ELECTRON BEAMS; LUMINESCENT DEVICES; MULTILAYERS; PARTIAL PRESSURE; RAPID THERMAL ANNEALING; SEMICONDUCTOR MATERIALS; STOICHIOMETRY; THIN FILMS; ZINC SULFIDE;

BAAL2S4; ELECTROLUMINESCENT DISPLAYS; IMPURITIES IN SEMICONDUCTORS; THERMAL ANNEALING;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 20344374711     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2005.04.001     Document Type: Article

References (9)

1. N. Miura, M. Kawanishi, H. Matsumoto, and R. Nakano Jpn. J. Appl. Phys. 38 Part 2 1999 L1291
2. N. Miura Proceedings of the 21st International Display Research Conference and 8th International Display Workshops Nagoya, Japan 2001 1059
3. P.F. Smet, D. Poelman, and R.L. Van Meirhaeghe J. Appl. Phys. 95 2004 184
4. Y. Inoue, I. Tanaka, K. Tanaka, Y. Izumi, S. Okamoto, M. Kawanishi, D. Barada, N. Miura, H. Matsumoto, and R. Nakano Jpn. J. Appl. Phys. 40 2001 2451
5. I. Tanaka, Y. Inoue, K. Tanaka, Y. Izumi, S. Okamoto, M. Kawanishi, N. Miura, H. Matsumoto, and R. Nakano J. Lumin. 96 2002 69
6. R. Vercaemst, D. Poelman, R.L. Van Meirhaeghe, L. Fiermans, W.H. Laflère, and F. Cardon J. Lumin. 63 1995 19
7. L.C. Feldman, and J.W. Mayer Fundamentals of Surface and Thin Film Analysis 1986 Elsevier Science Amsterdam
8. C.D. Wagner, W.M. Riggs, L.E. Davis, J.F. Moulder, and G.E. Muilenberg Handbook of X-ray Photoelectron Spectroscopy 1979 Perkin-Elmer Corporation Eden Prairie
9. M. Nakazawa, S. Kawase, and H. Sekiyama J. Appl. Phys. 65 10 1989 4014