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Volumn 294, Issue 2, 2005, Pages 152-158

Structural methods for studying nanocrystalline materials

Author keywords

Nanocrystalline; Small angle neutron scattering; Transmission electron microscopy; X ray diffraction

Indexed keywords

GRAIN SIZE AND SHAPE; MICROSTRUCTURE; NEUTRON SCATTERING; PLASTIC DEFORMATION; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

EID: 20344362953     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmmm.2005.03.029     Document Type: Conference Paper
Times cited : (15)

References (24)
  • 21
    • 20344372598 scopus 로고    scopus 로고
    • http://www.ill.fr/index_sc.html


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.