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Volumn 294, Issue 2, 2005, Pages 152-158
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Structural methods for studying nanocrystalline materials
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Author keywords
Nanocrystalline; Small angle neutron scattering; Transmission electron microscopy; X ray diffraction
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Indexed keywords
GRAIN SIZE AND SHAPE;
MICROSTRUCTURE;
NEUTRON SCATTERING;
PLASTIC DEFORMATION;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION ANALYSIS;
GRAIN SIZE DISTRIBUTION;
HARD MAGNETIC MATERIALS;
MAGNETIC EXCHANGE LENGTH;
X RAY DIFFRACTION LINE PROFILE ANALYSIS;
NANOSTRUCTURED MATERIALS;
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EID: 20344362953
PISSN: 03048853
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jmmm.2005.03.029 Document Type: Conference Paper |
Times cited : (15)
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References (24)
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