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Volumn 828, Issue , 2005, Pages 191-196
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FTIR analysis of the mechanisms of NOx detection by semiconductor metal oxide nanoparticles
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Author keywords
[No Author keywords available]
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Indexed keywords
CHEMICAL REACTIONS;
ELECTRIC CONDUCTIVITY;
FOURIER TRANSFORM INFRARED SPECTROSCOPY;
LIGHT ABSORPTION;
NITROGEN OXIDES;
OPTIMIZATION;
TIN COMPOUNDS;
ANIONIC SPECIES;
GAS DETECTION;
NANOPOWDERS;
SEMICONDUCTOR METAL OXIDE NANOPARTICLES;
NANOSTRUCTURED MATERIALS;
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EID: 20344362905
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (4)
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References (10)
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