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Volumn 828, Issue , 2005, Pages 191-196

FTIR analysis of the mechanisms of NOx detection by semiconductor metal oxide nanoparticles

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL REACTIONS; ELECTRIC CONDUCTIVITY; FOURIER TRANSFORM INFRARED SPECTROSCOPY; LIGHT ABSORPTION; NITROGEN OXIDES; OPTIMIZATION; TIN COMPOUNDS;

EID: 20344362905     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (4)

References (10)
  • 5
    • 4344684800 scopus 로고    scopus 로고
    • Surface analysis of semiconducting nanoparticles by FTIR spectroscopy: Application to the evaluation of gas sensing properties
    • eds. P. Knauth and J. Schoonman (Kluwer)
    • M.-I. Baraton, "Surface Analysis of Semiconducting Nanoparticles by FTIR Spectroscopy: Application to the Evaluation of Gas Sensing Properties", Nanocrystalline Metals and Oxides: Selected Properties and Applications, eds. P. Knauth and J. Schoonman (Kluwer, 2002) pp. 165-187.
    • (2002) Nanocrystalline Metals and Oxides: Selected Properties and Applications , pp. 165-187
    • Baraton, M.-I.1
  • 7
    • 0002410469 scopus 로고    scopus 로고
    • FT-IR surface spectrometries of nanosized particles
    • ed. H.S. Nalwa (Academic Press)
    • M.-I. Baraton, "FT-IR surface spectrometries of nanosized particles", Handbook of Nanostruct. Mater. & Nanotechnology, ed. H.S. Nalwa (Academic Press, 1999) pp. 89-153.
    • (1999) Handbook of Nanostruct. Mater. & Nanotechnology , pp. 89-153
    • Baraton, M.-I.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.