SCOPUS 정보 검색 플랫폼

Volumn 73, Issue 4, 2004, Pages 970-975

Resonant inelastic X-ray scattering at the K edge of Ge

Author keywords

Ge; Hard x ray; Resonant inelastic x ray scattering

Indexed keywords

GERMANIUM;

ARTICLE; CRYSTAL; DENSITY; ELECTRON; PHASE TRANSITION; PHOTON; RADIATION SCATTERING; SEMICONDUCTOR; SYNCHROTRON;

EID: 20144385655 PISSN: 00319015 EISSN: None Source Type: Journal
DOI: 10.1143/JPSJ.73.970 Document Type: Article

Times cited : (6)

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