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Volumn 235, Issue 1-4, 2005, Pages 131-134
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Comparisons of laboratory wavelength measurements with theoretical calculations for neon-like through lithium-like argon, sulfur and silicon
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Author keywords
Electron beam ion trap; Emission spectra; EUV lines; HULLAC
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Indexed keywords
ARGON;
CAMERAS;
CHARGE COUPLED DEVICES;
CHARGED PARTICLES;
CRYSTAL ATOMIC STRUCTURE;
ELECTRON TRAPS;
LITHIUM;
NEON;
SILICON;
SULFUR;
ULTRAVIOLET RADIATION;
X RAYS;
ELECTRON BEAM ION TRAP (EBIT);
EMISSION SPECTRA;
EUV LINES;
HULLAC;
WAVELENGTH MEASUREMENTS;
ELECTRON BEAMS;
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EID: 20144384766
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nimb.2005.03.159 Document Type: Conference Paper |
Times cited : (18)
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References (7)
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