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Volumn 30, Issue 5, 2005, Pages 388-391
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Center subpixel localization of circular retro-reflective targets
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Author keywords
Edge detection; Ellipse best fitting; Measurement based on images; Retro reflective targets (RRT); Subpixel
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Indexed keywords
IMAGE ANALYSIS;
IMAGE PROCESSING;
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EID: 20144377601
PISSN: 16718860
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (13)
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References (14)
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