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Volumn 5, Issue 6, 2002, Pages 64-
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Why silicon is the benchmark
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NONE
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Author keywords
[No Author keywords available]
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Indexed keywords
BENCHMARKING;
DATABASE SYSTEMS;
ELECTRONIC STRUCTURE;
GERMANIUM;
HALL EFFECT;
INTEGRATED CIRCUITS;
METALLORGANIC CHEMICAL VAPOR DEPOSITION;
MOLECULAR BEAM EPITAXY;
PROBABILITY DENSITY FUNCTION;
QUANTUM THEORY;
TRANSISTORS;
BENCHMARK THEORY;
ELECTRONIC INTERACTIONS;
GERMANIUM TRANSISTORS;
QUANTUM MOLECULAR DYNAMICS;
SEMICONDUCTING SILICON;
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EID: 20144363203
PISSN: 13697021
EISSN: None
Source Type: Journal
DOI: 10.1016/S1369-7021(02)00664-8 Document Type: Note |
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Times cited : (7)
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References (0)
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