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Volumn 97, Issue 1, 2005, Pages

Detection of nanometer-sized strain fields in (GaIn)(NAs) alloys by specific dark field transmission electron microscopic imaging

(3) Volz, Kerstin a Torunski, Torsten a Stolz, Wolfgang a

a PHILIPPS UNIVERSITY MARBURG (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPRESSIVE STRAIN; NANOMETER-SIZED STRAIN FIELDS; QUATERNARY ALLOYS; QUATERNARY MATERIALS;

COMPOSITION; FOURIER TRANSFORMS; IMAGING TECHNIQUES; METALLORGANIC VAPOR PHASE EPITAXY; MORPHOLOGY; PROBABILITY DENSITY FUNCTION; SEMICONDUCTOR QUANTUM WELLS; STRAIN; TERNARY SYSTEMS; TRANSMISSION ELECTRON MICROSCOPY;

GALLIUM ALLOYS;

EID: 19944434075 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.1823020 Document Type: Article

Times cited : (32)

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