Recent advances in the MICHELLE 2D/3D electron gun and collector modeling code

IEEE International Conference on Plasma Science

Volumn , Issue , 2004, Pages 321-

  Petillo, John ^a   Eppley, Kenneth ^a   Panagos, Dimitrios ^a   Nelson, Eric ^b   Dionne, Norman ^c   DeFord, John ^c   Held, Ben ^c   Chernyakova, Liya ^c   Burdette, James ^d   Zhai, Xiaoling ^d   Cattelino, Mark ^c   True, Richard ^c   Nguyen, Khanh ^e   Levush, Baruch ^c  

^a SCIENCE APPLICATIONS INTERNATIONAL CORPORATION   (United States)

^b LOS ALAMOS NATIONAL LABORATORY   (United States)

^c Raytheon ^*

^d BOEING COMPANY   (United States)

^e BW Research

Author keywords

[No Author keywords available]

Indexed keywords

BEAM OPTICS; ELECTRON COLLECTORS; ION THRUSTERS; PARTICLE-IN-CELL (PIC) CODES; VACUUM ELECTRON DEVICES;

ALGORITHMS; COMPUTER SIMULATION; ELECTRON BEAMS; ELECTROSTATICS; FINITE ELEMENT METHOD; ION SOURCES; PARTICLE BEAM TRACKING; PLASMA SOURCES; SECONDARY EMISSION; VACUUM APPLICATIONS;

ELECTRON GUNS;

EID: 19944433107     PISSN: 07309244     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)