Optothermal depth profiling by neural network infrared radiometry signal recognition

Journal of Applied Physics

Volumn 97, Issue 1, 2005, Pages

  Ravi, Jyotsna ^a   Lu, Yuekai ^a   Longuemart, St́phane ^a   Paoloni, Stefano ^b   Pfeiffer, Helge ^a   Thoen, Jan ^a   Glorieux, Christ ^a  

^a UNIVERSITY OF LEUVEN   (Belgium)

^b SAPIENZA UNIVERSITY OF ROME   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

BROADBAND DETECTION; NEURAL NETWORK INFRARED RADIOMETRY; PHOTOTHERMAL RADIOMETRY (PTR); RADIOMETRIC SIGNALS;

COMPUTER SIMULATION; INFRARED DETECTORS; INFRARED RADIATION; INTEGRATION; MATHEMATICAL MODELS; MULTILAYERS; RADIOMETRY;

NEURAL NETWORKS;

EID: 19944431717     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1821635     Document Type: Article

References (26)

1. L. Fabbri and P. Fenici, Rev. Sci. Instrum. 66, 3593 (1995).
2. M. Nestoros, A. Gutierrez-Llorente, A. Othonos, C. Christofides, and J. M. Martinez-Duart, J. Appl. Phys. 82, 6215 (1997).
3. S. A. Prahl, I. A. Vitkin, U. Bruggemann, B. C. Wilson, and R. R. Anderson, Phys. Med. Biol. 37, 1203 (1992).
4. M. E. Rodriguez, A. Mandelis, G. Pan, and J. A. Garcia, J. Appl. Phys. 87, 8113 (2000).
5. M. E. Rodríguez, J. A. Garcia, and A. Mandelis, Rev. Sci. Instrum. 74, 839 (2003).
6. H. G. Walther, D. Fournier, J. C. Krapez, M. Luukkala, B. Schmitz, C. Sibilia, H. Stamm, and J. Thoen, Anal. Sci. 17, 165 (2001).
7. P. Xiao, J. A. Cowen, and R. E. Imhof, Anal. Sci. 17, 349 (2001).
8. F. H. Long, R. R. Anderson, and T. F. Deutsch, Appl. Phys. Lett. 51, 2076 (1987).
9. C. Glorieux and J. Thoen, J. Appl. Phys. 80, 6510 (1996).
10. J. Karnicolas, S. W. Fu, and J. F. Power, Appl. Phys. B: Lasers Opt. 71, 217 (2003).
11. J. F. Power, J. Karnicolas, and S. W. Fu, Appl. Phys. B: Lasers Opt. 71, 57 (2000).
12. T. E. Milner, D. J. Smithies, D. M. Goodman, A. Lau, and J. S. Nelson, J. Opt. Soc. Am. A 12, 1479 (1995).
13. P. Xiao and R. E. Imhof, Proc. SPIE 3601, 340 (1999).
14. P. Xiao, S. F. Gull, and R. E. Imhof, Anal. Sci. 17, 394 (2001).
15. C. Glorieux, Z. Bozoki, J. Fivez, and J. Thoen, J. Appl. Phys. 78, 3096 (1995).
16. R. Santos and L. Miranda, J. Appl. Phys. 52, 6 (1981).
17. R. D. Tom, E. P. O'Hara, and D. Benin, J. Appl. Phys. 53, 5392 (1982).
18. A. C. Tam and B. Sullivan, Appl. Phys. Lett. 43, 333 (1983).
19. B. Majaron, W. Verkruysse, B. S. Tanenbaum, T. E. Milner, and J. S. Nelson, Phys. Med. Biol. 47, 1929 (2002).
20. U. Seidel and H. G. Walther, Rev. Sci. Instrum. 67, 3658 (1996).
21. C. Glorieux, J. Fivez, and J. Thoen, J. Appl. Phys. 73, 684 (1993).
22. Y. Nagasaka, T. Sato, and T. Ushiku, Meas. Sci. Technol. 12, 2081 (2001).
23. M. Norgaard, Institute of Automation, Technical University of Denmark, Report no. 95-E-773, 1995, unpublished.
24. A. Mandelis and M. M. Zver, J. Appl. Phys. 57, 4421 (1985).
25. M. Chirtoc and G. Mihailescu, Phys. Rev. B 40, 388 (1989).
26. M. Marinelli, U. Zammit, F. Mercuri, and R. Pizzoferrato, J. Appl. Phys. 72, 1096 (1992).