Depth of interaction measurement in gamma ray imaging detectors with continuous scintillation crystals

IEEE Nuclear Science Symposium Conference Record

Volumn 3, Issue , 2003, Pages 2169-2173

  Lerche, Ch W ^a   Benlloch, J M ^a   Sanchez F ^a   Pavon N ^a   Gimenez, E N ^a   Gimenez M ^a   Fernandez M ^a   Cerda J ^b   Martinez, J ^b   Sebastia A ^b  

^a INSTITUTO DE FÍSICA CORPUSCULAR IFIC   (Spain)

^b UNIVERSITAT POLITÈCNICA DE VALÈNCIA   (Spain)

Author keywords

Anger logic; Continuous scintillator; Depth of Interaction

Indexed keywords

CRYSTALS; IMAGING TECHNIQUES; INFORMATION ANALYSIS; PHOTODETECTORS; PHOTOMULTIPLIERS; POSITRON EMISSION TOMOGRAPHY; RESISTORS; SCINTILLATION;

AVALANCHE PHOTO-DIODES (APD); BGO-SCINTILLATORS; DEPTH OF INTERACTION (DOI); POSITRON SENSITIVE PROPOTIONAL (PSP);

GAMMA RAYS;

EID: 19944428415     PISSN: 10957863     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/nssmic.2003.1352310     Document Type: Conference Paper

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