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Volumn 2, Issue , 2003, Pages 1028-1033

Comparison of bulk and epitaxial 4H-SiC detectors for radiation hard particle tracking

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DATA REDUCTION; ELECTRIC FIELDS; ELECTRIC INSULATORS; FABRICATION; RADIATION HARDENING; SIGNAL PROCESSING; SILICON CARBIDE;

EID: 19944427763     PISSN: 10957863     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/nssmic.2003.1351868     Document Type: Conference Paper
Times cited : (9)

References (3)
  • 1
    • 0037680247 scopus 로고    scopus 로고
    • The charged particle response of silicon carbide semiconductor radiation detectors
    • F. H. Ruddy, A. R. Dulloo, J. G Seidel, J. W. Palmour and R. Singh, "The charged particle response of silicon carbide semiconductor radiation detectors,"Nucl. Instr. And Meth. A vol. 505, 2003, pp. 159-162.
    • (2003) Nucl. Instr. and Meth. A , vol.505 , pp. 159-162
    • Ruddy, F.H.1    Dulloo, A.R.2    Seidel, J.G.3    Palmour, J.W.4    Singh, R.5
  • 3
    • 0009695747 scopus 로고    scopus 로고
    • Theoretical calculations of the primary defects induced by pions and protons in SiC
    • S. Lazanu, I. Lazanu, E. Borchi and M. Bruzzi, "Theoretical calculations of the primary defects induced by pions and protons in SiC," Nucl. Instr. And Meth. A vol. 485, 2003, pp. 768-773.
    • (2003) Nucl. Instr. and Meth. A , vol.485 , pp. 768-773
    • Lazanu, S.1    Lazanu, I.2    Borchi, E.3    Bruzzi, M.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.