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Volumn 5448, Issue PART 2, 2004, Pages 681-692
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High-resolution EUV Microstepper tool for resist testing & technology evaluation
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Author keywords
EUV lithography; Microsteppers
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Indexed keywords
ABERRATIONS;
CONTAMINATION;
IMAGING TECHNIQUES;
INTEGRATED CIRCUITS;
LITHOGRAPHY;
MIRRORS;
OPTICAL RESOLVING POWER;
OPTICAL TESTING;
PHOTORESISTS;
SEMICONDUCTING SILICON;
ULTRAHIGH VACUUM;
VACUUM PUMPS;
DEPTH OF FOCUS (DOF);
EUV LITHOGRAPHY;
MICROSTEPPERS;
MOTOROLA (CO);
NUMERICAL APERTURE (NA);
STEPPING MOTORS;
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EID: 19944427267
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.548341 Document Type: Conference Paper |
Times cited : (11)
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References (0)
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