Optimization of X-ray absorbers for TES microcalorimeters

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5501, Issue , 2004, Pages 145-154

  Iyomoto, Naoko ^a   Sadleir, John E ^a   Figueroa Feliciano, Enectali ^a   Saab, Tarek ^a   Bandler, Simon ^a   Kilbourne, Caroline ^a   Chervenak, James ^a   Talley, Dorothy ^a   Finkbeiner, Fred ^a   Brekosky, Regis ^a   Lindeman, Mark ^a   Kelley, Richard ^a   Porter, Frederick S ^a   Boyce, Kevin ^a  

^a NASA HEADQUARTERS   (United States)

Author keywords

Bismuth; Microcalorimeter; TES; Thermalization; X ray

Indexed keywords

ARRAYS; CALORIMETERS; COPPER; SCANNING ELECTRON MICROSCOPY; THERMAL CONDUCTIVITY; THERMAL DIFFUSION; THERMOMETERS; X RAY SPECTROSCOPY;

ELECTRICAL CONDUCTIVITY; OPTIMAL THICKNESS; THERMALIZATION; TRANSITION-EDGE SENSORS (TES);

BISMUTH;

EID: 19944424448     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.552063     Document Type: Conference Paper

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