Towards particle size regulation of chemically deposited lead sulfide (PbS)

Journal of Crystal Growth

Volumn 280, Issue 1-2, 2005, Pages 300-308

  Rempel, A A ^a,b   Kozhevnikova, N S ^b   Leenaers, A J G ^a   Van Den Berghe, S ^a  

^a BELGIAN NUCLEAR RESEARCH CENTRE   (Belgium)

^b INSTITUTE OF SOLID STATE CHEMISTRY   (Russian Federation)

Author keywords

A1. Nanostructures; A2. Growth from solutions; A3. Chemical bath deposition processes; B1. Sulfides; B2. Semiconducting lead compounds

Indexed keywords

CHEMICAL VAPOR DEPOSITION; NANOSTRUCTURED MATERIALS; PARTICLE SIZE ANALYSIS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING LEAD COMPOUNDS; SOLUTIONS; SULFIDE MINERALS; SYNTHESIS (CHEMICAL); TEMPERATURE DISTRIBUTION; X RAY DIFFRACTION ANALYSIS;

CHEMICAL BATH DEPOSITION PROCESSES; GROWTH FROM SOLUTIONS; LEAD SULFIDE; PHOTOSENSITIVE PROPERTIES; SULFIDE;

LEAD;

EID: 19944417596     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2005.03.005     Document Type: Article

References (16)

1. G. Bauer, and H. Clemens Semicond. Sci. Technol. 5 1990 S122
2. D. Beydoun, R. Amal, G. Low, and S.J. McEvoy Nanopart. Res. 1 1999 439
3. A.P. Alivisatos Science 271 1996 933
4. D.J. Milliron, S.M. Hughes, Y. Cui, L. Manna, J. Li, L.-W. Wang, and A.P. Alivisatos Nature 430 2004 190
5. Z. Hens, D. Vanmaekelbergh, E.J.A.J. Stoffels, and H. van Kempen Phys. Rev. Lett. 88 2002 236803
6. A.R. Kortan, R. Hull, R.L. Opila, M.G. Bawendi, M.L. Steigerwald, P.J. Carroll, and L.E. Brus J. Am. Chem. Soc. 112 1990 1327
7. I. Prigogine, and R. Defay Chemical Thermodynamics 1962 Longmans London p. 543
8. N.S. Belova, and A.A. Rempel Russ. J. Inorg. Mater. 40 2003 7
9. D.K.G. De Boer, A.J.G. Leenaers, and W.W. Van Hoogenholf X-ray Spectrom. 24 1995 91
10. P. O'Brien, and J. McAleese J. Mater. Chem. 8 1998 2309
11. G.K. Williamson, and W.H. Hall Acta Metall. 1 1953 22
12. L. Pasquini, A.A. Rempel, R. Würschum, K. Reimann, M.A. Müller, B. Fultz, and H.-E. Schaefer Phys. Rev. B 63 2001 1
13. B.E. Warren X-ray Diffraction 1990 Dower Publications New York p. 381
14. N. Belova, A. Uritskaya, A. Kurlov, and A. Rempel Proceedings X APAM Topical Seminar and conference "Materials of Siberia" "Nanoscience and Technology", Novosibirsk 2003 p. 396
15. R.W. James The Optical Principles of the Diffraction of X-rays 1982 Ox Bow Press Woodbridge (Connecticut) p. 664 (reprint of 1962 edition)
16. A.I. Gusev, and A.A. Rempel Nanocrystalline Materials 2004 Cambridge International Science Publishing Cambridge p. 351