Rhodium particles supported by thin vanadia films as model systems for catalysis: An electron microscopy study

Thin Solid Films

Volumn 484, Issue 1-2, 2005, Pages 10-17

  Penner, S ^a   Wang, D ^b   Schlogl R ^b   Hayek, K ^a  

^a UNIVERSITY OF INNSBRUCK   (Austria)

^b FRITZ HABER INSTITUT DER MAX PLANCK GESELLSCHAFT   (Germany)

Author keywords

Catalysis; Electron energy loss spectroscopy; Transmission electron microscopy; Vanadium oxide

Indexed keywords

CRYSTAL ORIENTATION; DEPOSITION; ELECTRON DIFFRACTION; ELECTRON ENERGY LOSS SPECTROSCOPY; EPITAXIAL GROWTH; MATHEMATICAL MODELS; MORPHOLOGY; RHODIUM; SODIUM CHLORIDE; STOICHIOMETRY; TRANSMISSION ELECTRON MICROSCOPY; VANADIUM COMPOUNDS;

CATALYTIC PROPERTIES; CRYSTALLOGRAPHIC ORIENTATION; SELECTED AREA ELECTRON DIFFRACTION (SAED); VANADIA;

CATALYSIS;

EID: 19944415615     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2005.01.020     Document Type: Article

References (16)

1. M. Ichikawa, and K. Shikakura T. Seijama K. Tanabe Proceedings of the 7th Int. Congress on Catalysis, Kondansha, Tokyo 1980 1468
2. J. Kowalski, G. van der Lee, and V. Ponec Appl. Catal. 19 1985 423
3. S.J. Tauster, S.C. Fung, and R.L. Garten J. Am. Chem. Soc. 100 1978 170
4. H.J. Luo, A.G.T.M. Bastein, A.A.J.P. Mulder, and V. Ponec Appl. Catal. 38 1988 241
5. A.B. Boffa, C. Lin, A.T. Bell, and G.A. Somorjai Catal. Lett. 27 1994 243
6. T. Hartmann, and H. Knözinger Z. Phys. Chem. 197 1996 113
7. W. Reichl, and K. Hayek J. Catal. 208 2002 422
8. W. Reichl, and K. Hayek Surf. Sci. 537 2003 247
9. W. Reichl, and K. Hayek J. Catal. 222 2004 53
10. K. Hayek, B. Jenewein, B. Klötzer, and W. Reichl Top. Catal. 13 2000 55
11. G. Rupprechter, K. Hayek, L. Rendón, and M.J. Yacamán Thin Solid Films 260 1995 148
12. Powder Diffraction File, International Center for Diffraction Data 1994, PDF Series 2 Sets 1-47.
13. X.W. Lin, Y.Y. Wang, V.P. Dravid, P.M. Michalakos, and M.C. Kung Phys. Rev., B 47 1993 3477
14. D.S. Su, and R. Schlögl Catal. Lett. 83 2002 115
15. R.F. Egerton Electron energy loss spectroscopy in the electron microscope 1986 Plenum New York
16. G. Rupprechter, K. Hayek, and H. Hofmeister J. Catal. 173 1998 409