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Volumn 44, Issue 3, 2005, Pages 1450-1451

Mg II 448.1 nm spectral line stark broadening parameters

Author keywords

Plasma line; Profiles atomic data

Indexed keywords

CARRIER CONCENTRATION; ELECTRON ABSORPTION; ELECTRON EMISSION; ELECTRON TRANSITIONS; IONIZATION; NITROGEN; PERTURBATION TECHNIQUES; PLASMAS; THERMAL EFFECTS;

EID: 19944415328     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.44.1450     Document Type: Article
Times cited : (8)

References (19)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.