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Volumn 44, Issue 3, 2005, Pages 1450-1451
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Mg II 448.1 nm spectral line stark broadening parameters
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Author keywords
Plasma line; Profiles atomic data
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Indexed keywords
CARRIER CONCENTRATION;
ELECTRON ABSORPTION;
ELECTRON EMISSION;
ELECTRON TRANSITIONS;
IONIZATION;
NITROGEN;
PERTURBATION TECHNIQUES;
PLASMAS;
THERMAL EFFECTS;
PLASMA LINE;
PROFILES ATOMIC DATA;
SPECTRAL LINE;
STARK WIDTH;
MAGNESIUM PRINTING PLATES;
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EID: 19944415328
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/JJAP.44.1450 Document Type: Article |
Times cited : (8)
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References (19)
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