Oscillations in the thickness dependences of the room-temperature Seebeck coefficient in SnTe thin films

Thin Solid Films

Volumn 484, Issue 1-2, 2005, Pages 433-437

  Rogacheva, E I ^a   Nashchekina, O N ^a   Vekhov, Ye O ^a   Dresselhaus, M S ^b   Dresselhaus, G ^b  

^a NATIONAL TECHNICAL UNIVERSITY   (Ukraine)

^b USA   (United States)

Author keywords

Electrical properties and measurements; Epitaxy; Quantum effects; Tin telluride

Indexed keywords

EPITAXIAL GROWTH; OSCILLATIONS; POSITIVE IONS; QUANTUM THEORY; STOICHIOMETRY; THERMAL EFFECTS; THICKNESS MEASUREMENT; THIN FILMS;

ELECTRICAL PROPERTIES AND MEASUREMENTS; QUANTIZATION; QUANTUM EFFECTS; TIN TELLURIDE;

TIN COMPOUNDS;

EID: 19944404775     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2005.03.027     Document Type: Article

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