Dependence of electrode on switching effect of Pr1-xCa xMnO3 thin film

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 44, Issue 3, 2005, Pages 1260-1261

  Kim, Chang Jung ^a   Kim, Byung Ik ^a   Chen, I Wei ^a,b  

^a Korea Institute of Ceramic Engineering and Technology (KICET)   (South Korea)

^b UNIVERSITY OF PENNSYLVANIA   (United States)

Author keywords

Interface; Pr1 xcaxmno3; Resistance; Switching; Thin film; Top electrode

Indexed keywords

DEPOSITION; ELECTRIC RESISTANCE; ELECTRODES; FILM GROWTH; MAGNETRON SPUTTERING; PRASEODYMIUM COMPOUNDS; SWITCHING; X RAY DIFFRACTION ANALYSIS;

ELECTRIC-PULSE-INDUCED RESISTANCE (EPIR) SWITCHING; ELECTRICAL SWITCHING; PR1-XCAXMNO3 THIN FILMS; TOP-ELECTRODE MATERIALS;

THIN FILMS;

EID: 19944400157     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.44.1260     Document Type: Article

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