Atomic force microscopy study on blend morphology and clay dispersion in polyamide-6/polypropylene/organoclay systems

Journal of Polymer Science, Part B: Polymer Physics

Volumn 43, Issue 10, 2005, Pages 1198-1204

  Chow, W S ^a   Mohd Ishak, Z A ^a   Karger Kocsis, J ^b  

^a SCHOOL OF MATERIALS AND MINERAL RESOURCES ENGINEERING   (Malaysia)

^b INSTITUT FÜR VERBUNDWERKSTOFFE GMBH   (Germany)

Author keywords

Atomic force microscopy (AFM); Blend morphology; Etching; nanocomposites; Organoclay; Polyamide 6 polypropylene

Indexed keywords

ATOMIC FORCE MICROSCOPY; CLAY; DISPERSIONS; ETCHING; ION BOMBARDMENT; MORPHOLOGY; NANOSTRUCTURED MATERIALS; ORGANOMETALLICS; POLYMER BLENDS;

BLEND MORPHOLOGY; INTERFACIAL BONDING; ORGANOCLAY; PHASE STRUCTURE;

POLYAMIDES;

EID: 19944399455     PISSN: 08876266     EISSN: None     Source Type: Journal    
DOI: 10.1002/polb.20408     Document Type: Article

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