Rupture of thin stagnant films on a solid surface due to random thermal and mechanical perturbations

Journal of Colloid and Interface Science

Volumn 287, Issue 2, 2005, Pages 624-633

  Narsimhan, Ganesan ^a  

^a PURDUE UNIVERSITY   (United States)

Author keywords

Disjoining pressure; Electrostatic forces; First passage time; Pressure fluctuations; Stagnant thin film; Thermal fluctuations; Thin film rupture; Van der Waals forces

Indexed keywords

DIFFERENTIAL EQUATIONS; INTERFACES (MATERIALS); PERTURBATION TECHNIQUES; RANDOM PROCESSES; SURFACE TENSION; VAN DER WAALS FORCES; WHITE NOISE;

GAUSSIAN WHITE NOISE; STOCHASTIC DIFFERENTIAL EQUATIONS; THIN STAGNANT FILMS; WAVENUMBERS;

THIN FILMS;

AMPLITUDE MODULATION; ARTICLE; CALCULATION; ELECTRICITY; EVOLUTION; FILM; NOISE; PRIORITY JOURNAL; SOLID; STOCHASTIC MODEL; THERMAL ANALYSIS; WAVEFORM;

ALGORITHMS; CHEMISTRY, PHYSICAL; MEMBRANES, ARTIFICIAL; MODELS, CHEMICAL; SURFACE PROPERTIES;

EID: 19944398204     PISSN: 00219797     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcis.2005.02.029     Document Type: Article

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