Measurement of electric field by interferometric spectral trace observation

Optics Letters

Volumn 30, Issue 9, 2005, Pages 1063-1065

  Amat Roldán, Ivan ^a   Cormack, Iain G ^a   Loza Alvarez, Pablo ^a   Artigas, David ^b  

^a ICFO INSTITUT DE CIENCIES FOTONIQUES   (Spain)

^b UNIVERSITAT POLITÈCNICA DE CATALUNYA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

FOURIER ANALYSIS; NONLINEAR CRYSTALS; OPTICAL GATING; SPECTRAL TRACE OBSERVATION;

CRYSTALS; INTERFEROMETERS; MATHEMATICAL MODELS; NATURAL FREQUENCIES; OPTIMIZATION; SECOND HARMONIC GENERATION; ULTRASHORT PULSES;

ELECTRIC FIELD EFFECTS;

EID: 19944390212     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.30.001063     Document Type: Article

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