Influence of helium-ion bombardment on the surface properties of pure and ammonia-adsorbed water thin films

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 232, Issue 1-4, 2005, Pages 140-145

  Kondo, M ^a,b   Shibata, T ^a,b   Kawanowa, H ^a,b   Gotoh, Y ^b   Souda, R ^a,b  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b TOKYO UNIVERSITY OF SCIENCE   (Japan)

Author keywords

Ammonia; H D exchange; Sputtering; Time of flight secondary ion mass spectrometry; Water

Indexed keywords

ADSORPTION; AMMONIA; HELIUM; ION BOMBARDMENT; MONOLAYERS; OPTIMIZATION; SECONDARY ION MASS SPECTROMETRY; SPUTTERING; THERMAL EFFECTS; WATER;

H/D EXCHANGE; TIME-OF-FLIGHT SECONDARY ION MASS SPECTROMETRY (TOF-SIMS); WATER THIN FILMS; WATER-ICE FILMS;

THIN FILMS;

EID: 19944387926     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2005.03.036     Document Type: Conference Paper

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